TY - JOUR
T1 - New opportunities in transmission electron microscopy of polymers
AU - Kuei, Brooke
AU - Aplan, Melissa P.
AU - Litofsky, Joshua H.
AU - Gomez, Enrique D.
N1 - Publisher Copyright:
© 2019
PY - 2020/1
Y1 - 2020/1
N2 - Recent advances in instrumentation for transmission electron microscopy have pushed the resolution limit, leading to remarkable instruments capable of imaging at 0.5 Å. But, when imaging soft materials, the resolution is often limited by the amount of dose the material can handle rather than the instrumental resolution. Despite the strong constraints placed by radiation sensitivity, recent developments in electron microscopes have the potential to advance polymer electron microscopy. For example, the focused ion beam creates opportunities for site-specific imaging, recently developed sample holders enable liquid TEM, monochromated sources lead to spectroscopy and imaging based on the valence electronic structure, and direct electron detectors minimize the required dose for imaging. Transmission electron microscopy has transformed the field of polymer science, and it is poised to do so again in the near future.
AB - Recent advances in instrumentation for transmission electron microscopy have pushed the resolution limit, leading to remarkable instruments capable of imaging at 0.5 Å. But, when imaging soft materials, the resolution is often limited by the amount of dose the material can handle rather than the instrumental resolution. Despite the strong constraints placed by radiation sensitivity, recent developments in electron microscopes have the potential to advance polymer electron microscopy. For example, the focused ion beam creates opportunities for site-specific imaging, recently developed sample holders enable liquid TEM, monochromated sources lead to spectroscopy and imaging based on the valence electronic structure, and direct electron detectors minimize the required dose for imaging. Transmission electron microscopy has transformed the field of polymer science, and it is poised to do so again in the near future.
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U2 - 10.1016/j.mser.2019.100516
DO - 10.1016/j.mser.2019.100516
M3 - Review article
AN - SCOPUS:85072711844
SN - 0927-796X
VL - 139
JO - Materials Science and Engineering R: Reports
JF - Materials Science and Engineering R: Reports
M1 - 100516
ER -