Abstract
This paper introduces a new technique based on the application of the Genetic Algorithm (GA) for extracting the equivalent circuits for measured or computed S-parameters that can be inserted into SPICE simulations. The GA is a robust optimization tool that is shown to yield excellent result for the sample test case of a right angle bend in a microstrip line.
| Original language | English (US) |
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| Pages | 70-73 |
| Number of pages | 4 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 6th Topical Meeting on Electrical Performance of Electronic Packaging - San Jose, CA, USA Duration: Oct 27 1997 → Oct 29 1997 |
Other
| Other | Proceedings of the 1997 6th Topical Meeting on Electrical Performance of Electronic Packaging |
|---|---|
| City | San Jose, CA, USA |
| Period | 10/27/97 → 10/29/97 |
All Science Journal Classification (ASJC) codes
- General Engineering