TY - GEN
T1 - Noise induced jitter in differential signaling
AU - Chandrasekhar, Janani
AU - Engin, Ege
AU - Swaminathan, Madhavan
AU - Uriu, Kazuhide
AU - Yamada, Toru
PY - 2008
Y1 - 2008
N2 - Differential lines are extensively used in high-speed digital circuits due to their ability to improve signal integrity by rejecting common-mode noise. However noise is injected into differential signals when there are irregularities in the signaling setup. These anomalies may be via transitions of differential lines through power planes in power distribution systems, via stubs, asymmetric lengths of differential lines, different transition points for each of the differential vias etc. This paper quantifies noise due to irregular differential structures in frequency domain. Presence of noise in differential signaling is verified through a set of test vehicles. The effect of signal to power coupling from differential lines on signal jitter is also investigated.
AB - Differential lines are extensively used in high-speed digital circuits due to their ability to improve signal integrity by rejecting common-mode noise. However noise is injected into differential signals when there are irregularities in the signaling setup. These anomalies may be via transitions of differential lines through power planes in power distribution systems, via stubs, asymmetric lengths of differential lines, different transition points for each of the differential vias etc. This paper quantifies noise due to irregular differential structures in frequency domain. Presence of noise in differential signaling is verified through a set of test vehicles. The effect of signal to power coupling from differential lines on signal jitter is also investigated.
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U2 - 10.1109/ECTC.2008.4550218
DO - 10.1109/ECTC.2008.4550218
M3 - Conference contribution
AN - SCOPUS:51349094841
SN - 9781424422302
T3 - Proceedings - Electronic Components and Technology Conference
SP - 1755
EP - 1761
BT - 2008 Proceedings 58th Electronic Components and Technology Conference, ECTC
T2 - 2008 58th Electronic Components and Technology Conference, ECTC
Y2 - 27 May 2008 through 30 May 2008
ER -