Non-axial-scanning second harmonic microscopy

Chuan Yang; Kebin Shi; Haifeng Li; Qian Xu; Venkatraman Gopalan; Zhiwen Liu

Non-axial-scanning second harmonic microscopy

Chuan Yang, Kebin Shi, Haifeng Li, Qian Xu, Venkatraman Gopalan, Zhiwen Liu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.

Original language	English (US)
Title of host publication	2011 Conference on Lasers and Electro-Optics
Subtitle of host publication	Laser Science to Photonic Applications, CLEO 2011
State	Published - 2011
Event	2011 Conference on Lasers and Electro-Optics, CLEO 2011 - Baltimore, MD, United States Duration: May 1 2011 → May 6 2011

Publication series

Name	2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011

Other

Other	2011 Conference on Lasers and Electro-Optics, CLEO 2011
Country/Territory	United States
City	Baltimore, MD
Period	5/1/11 → 5/6/11

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

Cite this

@inproceedings{f8059c15b0d24d4fb2b84879781b88a4,

title = "Non-axial-scanning second harmonic microscopy",

abstract = "We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.",

author = "Chuan Yang and Kebin Shi and Haifeng Li and Qian Xu and Venkatraman Gopalan and Zhiwen Liu",

year = "2011",

language = "English (US)",

isbn = "9781557529107",

series = "2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011",

booktitle = "2011 Conference on Lasers and Electro-Optics",

note = "2011 Conference on Lasers and Electro-Optics, CLEO 2011 ; Conference date: 01-05-2011 Through 06-05-2011",

}

Yang, C, Shi, K, Li, H, Xu, Q, Gopalan, V & Liu, Z 2011, Non-axial-scanning second harmonic microscopy. in 2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011., 5950961, 2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011, 2011 Conference on Lasers and Electro-Optics, CLEO 2011, Baltimore, MD, United States, 5/1/11.

Non-axial-scanning second harmonic microscopy. / Yang, Chuan; Shi, Kebin; Li, Haifeng et al.
2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011. 2011. 5950961 (2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Non-axial-scanning second harmonic microscopy

AU - Yang, Chuan

AU - Shi, Kebin

AU - Li, Haifeng

AU - Xu, Qian

AU - Gopalan, Venkatraman

AU - Liu, Zhiwen

PY - 2011

Y1 - 2011

N2 - We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.

AB - We demonstrate a chromatic second harmonic imaging technique that exploits the chromatic aberration of a Fresnel lens to focus different wavelengths into different axial positions to effectively realize axial scanning and improve imaging speed.

UR - http://www.scopus.com/inward/record.url?scp=80052123813&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80052123813&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:80052123813

SN - 9781557529107

T3 - 2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011

BT - 2011 Conference on Lasers and Electro-Optics

T2 - 2011 Conference on Lasers and Electro-Optics, CLEO 2011

Y2 - 1 May 2011 through 6 May 2011

ER -

Non-axial-scanning second harmonic microscopy

Abstract

Publication series

Other

All Science Journal Classification (ASJC) codes

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