TY - GEN
T1 - Novel application of spintronics in computing, sensing, storage and cybersecurity
AU - Motaman, Seyedhamidreza
AU - Khan, Mohammad Nasim Imtiaz
AU - Ghosh, Swaroop
N1 - Funding Information:
This work was supported by SRC Task#2727.001, NSF CNS - 1722557, CCF- 1718474 and DARPA [3 Young Faculty Award #D15AP00089. Authors also thank collaborators Dr. Jongsun Park and Dr. Rashmi Jha.
Publisher Copyright:
© 2018 EDAA.
PY - 2018/4/19
Y1 - 2018/4/19
N2 - With conventional Von Neumann computing struggling to match the energy-efficiency of biological systems, there is pressing need to explore alternative computing models. CMOS switches, although universal, fails to offer additional features to meet this end goal Recent experimental studies have revealed that spintronics possess many promising features that can not only enable non Von Neumann compute models but also high-density storage, sensing of environmental parameters and protection from cybersecurity threats. This paper provides an in-depth study of spintronics and its relation to these novel aspects from device, circuit and system standpoint.
AB - With conventional Von Neumann computing struggling to match the energy-efficiency of biological systems, there is pressing need to explore alternative computing models. CMOS switches, although universal, fails to offer additional features to meet this end goal Recent experimental studies have revealed that spintronics possess many promising features that can not only enable non Von Neumann compute models but also high-density storage, sensing of environmental parameters and protection from cybersecurity threats. This paper provides an in-depth study of spintronics and its relation to these novel aspects from device, circuit and system standpoint.
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U2 - 10.23919/DATE.2018.8341991
DO - 10.23919/DATE.2018.8341991
M3 - Conference contribution
AN - SCOPUS:85048803351
T3 - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
SP - 125
EP - 130
BT - Proceedings of the 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 Design, Automation and Test in Europe Conference and Exhibition, DATE 2018
Y2 - 19 March 2018 through 23 March 2018
ER -