Novel MCM interconnect test technique based on resonator principles and transmission line theory

Bruce C. Kim; Madhavan Swaminathan; Abhijit Chatterjee

Novel MCM interconnect test technique based on resonator principles and transmission line theory

Bruce C. Kim, Madhavan Swaminathan, Abhijit Chatterjee

Electrical Engineering

Research output: Contribution to conference › Paper › peer-review

2 Scopus citations

Abstract

This paper describes a new technique for detecting and diagnosing process-related interconnect faults in MCMs. The technique uses a single-ended probe with a resonator and a waveform generator. A complete fault diagnosis is possible through measurement of magnitude and phase responses.

Original language	English (US)
Pages	117-119
Number of pages	3
State	Published - 1995
Event	Proceedings of the IEEE 4th Topical Meeting on Electrical Performance of Electronic Packaging - Portland, OR, USA Duration: Oct 2 1995 → Oct 4 1995

Conference

Conference	Proceedings of the IEEE 4th Topical Meeting on Electrical Performance of Electronic Packaging
City	Portland, OR, USA
Period	10/2/95 → 10/4/95

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

@conference{909c324a58db4a7385ee6c7a66cf226a,

title = "Novel MCM interconnect test technique based on resonator principles and transmission line theory",

abstract = "This paper describes a new technique for detecting and diagnosing process-related interconnect faults in MCMs. The technique uses a single-ended probe with a resonator and a waveform generator. A complete fault diagnosis is possible through measurement of magnitude and phase responses.",

author = "Kim, {Bruce C.} and Madhavan Swaminathan and Abhijit Chatterjee",

year = "1995",

language = "English (US)",

pages = "117--119",

note = "Proceedings of the IEEE 4th Topical Meeting on Electrical Performance of Electronic Packaging ; Conference date: 02-10-1995 Through 04-10-1995",

}

Novel MCM interconnect test technique based on resonator principles and transmission line theory. / Kim, Bruce C.; Swaminathan, Madhavan; Chatterjee, Abhijit.
1995. 117-119 Paper presented at Proceedings of the IEEE 4th Topical Meeting on Electrical Performance of Electronic Packaging, Portland, OR, USA.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Novel MCM interconnect test technique based on resonator principles and transmission line theory

AU - Kim, Bruce C.

AU - Swaminathan, Madhavan

AU - Chatterjee, Abhijit

PY - 1995

Y1 - 1995

N2 - This paper describes a new technique for detecting and diagnosing process-related interconnect faults in MCMs. The technique uses a single-ended probe with a resonator and a waveform generator. A complete fault diagnosis is possible through measurement of magnitude and phase responses.

AB - This paper describes a new technique for detecting and diagnosing process-related interconnect faults in MCMs. The technique uses a single-ended probe with a resonator and a waveform generator. A complete fault diagnosis is possible through measurement of magnitude and phase responses.

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UR - http://www.scopus.com/inward/citedby.url?scp=0029521330&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0029521330

SP - 117

EP - 119

T2 - Proceedings of the IEEE 4th Topical Meeting on Electrical Performance of Electronic Packaging

Y2 - 2 October 1995 through 4 October 1995

ER -

Novel MCM interconnect test technique based on resonator principles and transmission line theory

Abstract

Conference

All Science Journal Classification (ASJC) codes

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