Numerical modeling of capacitive array sensors using the finite element method

P. R. Heyliger, J. C. Moulder, Peter J. Shull, M. Gimple, B. A. Auld

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Scopus citations


The numerical simulation of a capacitive array sensor and its performance relating to flaw detection in dielectric and metal plates is addressed. Solutions are presented for field equations for the geometry, material properties, and boundary conditions corresponding to the effect of the presence of a flawed plate on the sensor. Probe response was calculated as the change in admittance which was computed using a line integral that is a function of the scalar potential and its normal derivative with respect to the specimen surface. The electrostatic potentials were calculated using a two-dimensional finite element method. Results of several parametric studies which show the relative effects of flaw size, specimen dielectric constant, and probe liftoff distance are presented.

Original languageEnglish (US)
Title of host publicationReview of Progress in Quantitative Nondestructive Evaluation
Number of pages8
Volume7 A
StatePublished - Dec 1 1988

All Science Journal Classification (ASJC) codes

  • General Engineering


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