Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope

T. J. Yang; U. Mohideen; Venkat Gopalan; P. Swart

doi:10.1080/00150199908014837

Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope

T. J. Yang, U. Mohideen, Venkat Gopalan, P. Swart

Research output: Contribution to journal › Article › peer-review

Abstract

We have made a direct and nanometer scale observation of single 180° domain walls in 500 μm thick ferroelectric LiTaO₃ by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-100nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180° domain wall under a uniform applied electric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.

Original language	English (US)
Pages (from-to)	351-358
Number of pages	8
Journal	Ferroelectrics
Volume	222
Issue number	1-4
DOIs	https://doi.org/10.1080/00150199908014837
State	Published - 1999

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1080/00150199908014837

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title = "Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope",

abstract = "We have made a direct and nanometer scale observation of single 180° domain walls in 500 μm thick ferroelectric LiTaO3 by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-100nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180° domain wall under a uniform applied electric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.",

author = "Yang, {T. J.} and U. Mohideen and Venkat Gopalan and P. Swart",

note = "Funding Information: birefringence. This work was conducted under the auspices of the US Department of Energy, supported (in part) by funds provided by the University of California for the conduct of discretionary research by Los Alamos National Laboratory.",

year = "1999",

doi = "10.1080/00150199908014837",

language = "English (US)",

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T1 - Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope

AU - Yang, T. J.

AU - Mohideen, U.

AU - Gopalan, Venkat

AU - Swart, P.

N1 - Funding Information: birefringence. This work was conducted under the auspices of the US Department of Energy, supported (in part) by funds provided by the University of California for the conduct of discretionary research by Los Alamos National Laboratory.

PY - 1999

Y1 - 1999

N2 - We have made a direct and nanometer scale observation of single 180° domain walls in 500 μm thick ferroelectric LiTaO3 by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-100nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180° domain wall under a uniform applied electric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.

AB - We have made a direct and nanometer scale observation of single 180° domain walls in 500 μm thick ferroelectric LiTaO3 by using a collection mode Near-Field Scanning Optical Microscope. We unambiguously identify single domain walls by simultaneously recording nanometer scale topographic and optical images. The polarization rotation of a linear polarized laser beam due to the birefringence at the domain wall is optically imaged with 80-100nm spatial resolution. Next we have made a direct nanometer scale study of the mobility of a single 180° domain wall under a uniform applied electric field using the same technique. The mobility of the domain walls is strongly influenced by sub-surface pinning defects.

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JO - Ferroelectrics

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IS - 1-4

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Observation and mobility study of single 180° domain wall using a near-field scanning optical microscope

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