Observation of Berezinski-Kosterlitz-Thouless transition in PrYBaCuO/YBaCuO/PrYBaCuO trilayers

Vitali A. Gasparov, I. E. Batov, Qi Li, Chuhe Kwon

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

The temperature dependencies of electromagnetic penetration depth λa,b(T) and high-frequency losses Reσ(T) have been investigated using the radio-frequency (1-20 MHz) and microwave (30 GHz) surface impedance methods on 1 unit cell (UC) and 2UC-thick Y1Ba 2Cu3O7-x epitaxial films sandwiched between Pr0.6Y0.4Ba2Cu3O7-x epitaxial layers. It was observed that the λa,b -2(T) component exhibits a clear break near the critical temperature Tc from a linear BCS-like dependence at low temperatures, and a maximum in Reσ(T) close to the onset point of Lk -1(T). The break is destroyed in a very small perpendicular magnetic field (∼1 mT). This feature exhibit saturation as a function of the magnetic field in the range 3-5 mT. At the same time, no influence of the same H on the Reσ(T) dependence at microwave frequencies was detected. A huge increase in Tc (70% and 30% for 1UC and 2UC samples, respectively) as a function offrequency within the frequency range 1 MHz - 30 GHz was discovered. All these features are explained and discussed in the framework of dynamic theories of BKT transition.

Original languageEnglish (US)
Pages (from-to)391-402
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2697
DOIs
StatePublished - 1996
EventOxide Superconductor Physics and Nano-Engineering II - San Jose, CA, United States
Duration: Jan 30 1996Jan 30 1996

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Observation of Berezinski-Kosterlitz-Thouless transition in PrYBaCuO/YBaCuO/PrYBaCuO trilayers'. Together they form a unique fingerprint.

Cite this