On D-optimal robust designs for lifetime improvement experiments

Rabindra Nath Das, Dennis K.J. Lin

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


Locating the optimal operating conditions of the process parameters is critical in a lifetime improvement experiment. For log-normal lifetime distribution with compound error structure (i.e., symmetry, inter-class and intra-class correlation error structures), we have developed methods for construction of D-optimal robust first order designs. It is shown that D-optimal robust first order designs are always robust first order rotatable but the converse is not always true.

Original languageEnglish (US)
Pages (from-to)3753-3759
Number of pages7
JournalJournal of Statistical Planning and Inference
Issue number12
StatePublished - Dec 2011

All Science Journal Classification (ASJC) codes

  • Statistics and Probability
  • Statistics, Probability and Uncertainty
  • Applied Mathematics


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