On D-optimal robust designs for lifetime improvement experiments

Rabindra Nath Das; Dennis K.J. Lin

doi:10.1016/j.jspi.2011.06.011

On D-optimal robust designs for lifetime improvement experiments

Rabindra Nath Das, Dennis K.J. Lin

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Abstract

Locating the optimal operating conditions of the process parameters is critical in a lifetime improvement experiment. For log-normal lifetime distribution with compound error structure (i.e., symmetry, inter-class and intra-class correlation error structures), we have developed methods for construction of D-optimal robust first order designs. It is shown that D-optimal robust first order designs are always robust first order rotatable but the converse is not always true.

Original language	English (US)
Pages (from-to)	3753-3759
Number of pages	7
Journal	Journal of Statistical Planning and Inference
Volume	141
Issue number	12
DOIs	https://doi.org/10.1016/j.jspi.2011.06.011
State	Published - Dec 2011

All Science Journal Classification (ASJC) codes

Statistics and Probability
Statistics, Probability and Uncertainty
Applied Mathematics

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10.1016/j.jspi.2011.06.011

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abstract = "Locating the optimal operating conditions of the process parameters is critical in a lifetime improvement experiment. For log-normal lifetime distribution with compound error structure (i.e., symmetry, inter-class and intra-class correlation error structures), we have developed methods for construction of D-optimal robust first order designs. It is shown that D-optimal robust first order designs are always robust first order rotatable but the converse is not always true.",

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On D-optimal robust designs for lifetime improvement experiments

Abstract

All Science Journal Classification (ASJC) codes

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