@inproceedings{75e9e3b1d3d74151a5d97ce1347ab31b,
title = "On de-embedding phase for high speed connectors",
abstract = "The phase error problem in de-embedding is examined for board structures and devices under test (DUT). The main feature of this paper is the comparison between the Sparameter data for the embedded DUT and the data for a judiciously chosen reference situation. It is important to note that de-embedding the phase is essential in the design of high-speed connectors in consumer electronics hardware, especially in providing {"}swappable{"} models for high-end microprocessor-based applications.",
author = "Aldo Morales and Sedig Agili and Shilpa Gaddala",
year = "2008",
doi = "10.1109/ICCE.2008.4588007",
language = "English (US)",
isbn = "142441458X",
series = "Digest of Technical Papers - IEEE International Conference on Consumer Electronics",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2008 Digest of Technical Papers International Conference on Consumer Electronics, The Mobile Consumer, ICCE 2008",
address = "United States",
note = "2008 Digest of Technical Papers - International Conference on Consumer Electronics, ICCE 2008 ; Conference date: 09-01-2008 Through 13-01-2008",
}