On optical-absorption peaks in a nonhomogeneous dielectric material over a two-dimensional metallic surface-relief grating

Faiz Ahmad, Tom H. Anderson, Benjamin J. Civiletti, Peter B. Monk, Akhlesh Lakhtakia

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

The rigorous coupled-wave approach (RCWA) was used to calculate the optical absorption in a dielectric material deposited over a two-dimensional (2D) metallic surface-relief grating. The dielectric material was taken to be nonhomogeneous in the direction normal to the mean plane of the grating. The grating was chosen to comprise hillocks on a square grid. On illumination by a monochromatic plane waves, the chosen structure should support the excitation of two types of guided-wave modes: surface-plasmon-polariton (SPP) waves and waveguide modes (WGMs). Two cases were considered: (i) a 1D photonic crystal made from layers of silicon oxynitrides of differing composition, and (ii) a tandem solar cell comprising three amorphous-silicon p-i-n junctions. Optical absorption was studied in relation to the direction of propagation, polarization state, and the free-space wavelength of the incident plane wave. Several but not all absorptance peaks were correlated with the excitations of SPP-wave modes and WGMs predicted by the solutions of the underlying canonical boundary-value problems for guided-wave propagation. Some peaks of useful absorptances in the solar cell were also predicted by solutions of the canonical problems.

Original languageEnglish (US)
Title of host publicationNanostructured Thin Films X
EditorsTom G. Mackay, Yi-Jun Jen, Akhlesh Lakhtakia
PublisherSPIE
ISBN (Electronic)9781510611696
DOIs
StatePublished - 2017
EventNanostructured Thin Films X 2017 - San Diego, United States
Duration: Aug 9 2017Aug 10 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10356
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherNanostructured Thin Films X 2017
Country/TerritoryUnited States
CitySan Diego
Period8/9/178/10/17

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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