Abstract
An approach is presented for the determination of the residual stresses and elastic moduli of particle systems resulting from computer simulations of particle or atomic deposition. The proposed technique is based on fundamental concepts of elasticity and is capable of capturing the variation of stresses and moduli as functions of position within the system. Application to a perfect FCC crystal and a simple particle system is demonstrated.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 280-290 |
| Number of pages | 11 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4097 |
| State | Published - 2000 |
| Event | Complex Mediums - San Diego, CA, USA Duration: Jul 30 2000 → Aug 1 2000 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering