TY - GEN
T1 - Online system-identification using subspace algorithms for the control of microscopic processes
AU - Pitchaiah, Sivakumar
AU - Armaou, Antonios
PY - 2008
Y1 - 2008
N2 - The problem of online system identification and control of microscopic processes is considered. Traditionally, such processes are numerically simulated employing atomistic simulations. The unavailability of closed-form models to describe the evolution makes the controller design task challenging. A methodology is developed in which subspace algorithms for bilinear system identification are coupled with feedback linearization techniques with objective the online identification and control of microscopic processes. We illustrate the applicability of the proposed methodology on a Kinetic Monte Carlo (KMC) realization of a simplified surface reaction scheme that describes the dynamics of CO oxidation by O2 on a Pt catalytic surface. The proposed controller successfully forces the process from one stationary state to another state.
AB - The problem of online system identification and control of microscopic processes is considered. Traditionally, such processes are numerically simulated employing atomistic simulations. The unavailability of closed-form models to describe the evolution makes the controller design task challenging. A methodology is developed in which subspace algorithms for bilinear system identification are coupled with feedback linearization techniques with objective the online identification and control of microscopic processes. We illustrate the applicability of the proposed methodology on a Kinetic Monte Carlo (KMC) realization of a simplified surface reaction scheme that describes the dynamics of CO oxidation by O2 on a Pt catalytic surface. The proposed controller successfully forces the process from one stationary state to another state.
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U2 - 10.1109/ACC.2008.4587189
DO - 10.1109/ACC.2008.4587189
M3 - Conference contribution
AN - SCOPUS:52449092251
SN - 9781424420797
T3 - Proceedings of the American Control Conference
SP - 4413
EP - 4418
BT - 2008 American Control Conference, ACC
T2 - 2008 American Control Conference, ACC
Y2 - 11 June 2008 through 13 June 2008
ER -