@inproceedings{a35a8a8c041c496b8efb99ac1545bdb4,
title = "Optical and x-ray alignment approaches for off-plane reflection gratings",
abstract = "Off-plane reflection gratings offer the potential for high-resolution, high-throughput X-ray spectroscopy on future missions. Typically, the gratings are placed in the path of a converging beam from an X-ray telescope. In the off-plane reflection grating case, these gratings must be co-aligned such that their diffracted spectra overlap at the focal plane. Misalignments degrade spectral resolution and effective area. In-situ X-ray alignment of a pair of off-plane reflection gratings in the path of a silicon pore optics module has been performed at the MPE PANTER beamline in Germany. However, in-situ X-ray alignment may not be feasible when assembling all of the gratings required for a satellite mission. In that event, optical methods must be developed to achieve spectral alignment. We have developed an alignment approach utilizing a Shack-Hartmann wavefront sensor and diffraction of an ultraviolet laser. We are fabricating the necessary hardware, and will be taking a prototype grating module to an X-ray beamline for performance testing following assembly and alignment.",
author = "Ryan Allured and Donovan, {Benjamin D.} and DeRoo, {Casey T.} and Marlowe, {Hannah R.} and McEntaffer, {Randall L.} and Tutt, {James H.} and Cheimets, {Peter N.} and Edward Hertz and Smith, {Randall K.} and Vadim Burwitz and Gisela Hartner and Benedikt Menz",
note = "Publisher Copyright: {\textcopyright} 2015 SPIE.; Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII ; Conference date: 10-08-2015 Through 13-08-2015",
year = "2015",
doi = "10.1117/12.2186412",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Giovanni Pareschi and O'Dell, {Stephen L.} and Giovanni Pareschi and O'Dell, {Stephen L.}",
booktitle = "Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII",
address = "United States",
}