Optimal Accelerated Lifetime Plans that Mimimize the Maxiumum Test-Stress

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17 Scopus citations


This paper proposes a variation of the optimum accelerated lifetest plans described by Nelson and others, and shows how to minimize the maximum test-stress that is required, subject to meeting a certain standard-deviation limit on the estimate. Previous optimal lifetest plans have shown how to minimize the standard-deviation of the estimated product life, subject to a given maximum test-stress. Reader Aids - Purpose: Tutorial Special math needed for explanations: Elementary statistics and optimization Special math needed for results: None Results useful to: Reliability analysts.

Original languageEnglish (US)
Pages (from-to)166-172
Number of pages7
JournalIEEE Transactions on Reliability
Issue number2
StatePublished - Jun 1991

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering


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