Abstract
This paper proposes a variation of the optimum accelerated lifetest plans described by Nelson and others, and shows how to minimize the maximum test-stress that is required, subject to meeting a certain standard-deviation limit on the estimate. Previous optimal lifetest plans have shown how to minimize the standard-deviation of the estimated product life, subject to a given maximum test-stress. Reader Aids - Purpose: Tutorial Special math needed for explanations: Elementary statistics and optimization Special math needed for results: None Results useful to: Reliability analysts.
Original language | English (US) |
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Pages (from-to) | 166-172 |
Number of pages | 7 |
Journal | IEEE Transactions on Reliability |
Volume | 40 |
Issue number | 2 |
DOIs | |
State | Published - Jun 1991 |
All Science Journal Classification (ASJC) codes
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering