Abstract
In order to elucidate the driving forces which promote oriented in-plane crystallographic texture in SrRuO3 thin films deposited on stepped SrTiO3 substrates, a high-temperature x-ray analysis of both SrRuO3 thin films and powders was conducted. Structural phase transitions were found at temperatures near 350°C and slightly above 600°C. The transitions are tentatively indexed as orthorhombic to tetragonal and tetragonal to cubic, respectively. These results suggest that SrRuO3 thin films grow with cubic symmetry. As such, film-substrate interfacial characteristics, rather than a preferred growth direction, are believed to determine the orientation of orthorhombic twins.
Original language | English (US) |
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Pages (from-to) | 3382-3384 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 76 |
Issue number | 23 |
DOIs | |
State | Published - Jun 5 2000 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)