Abstract
The Advanced X-ray Imaging Satellite (AXIS) is a Probe-class concept that will build on the legacy of the Chandra X-ray Observatory by providing low-background, arcsecond-resolution imaging in the 0.3-10 keV band across a 450 arcminute2 field of view, with an order of magnitude improvement in sensitivity. AXIS utilizes breakthroughs in the construction of lightweight segmented X-ray optics using single-crystal silicon, and developments in the fabrication of large-format, small-pixel, high readout rate CCD detectors with good spectral resolution, allowing a robust and cost-effective design. Further, AXIS will be responsive to target-of-opportunity alerts and, with onboard transient detection, will be a powerful facility for studying the time-varying X-ray universe, following on from the legacy of the Neil Gehrels (Swift) X-ray observatory that revolutionized studies of the transient X-ray Universe. In this paper, we present an overview of AXIS, highlighting the prime science objectives driving the AXIS concept and how the observatory design will achieve these objectives.
Original language | English (US) |
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Title of host publication | UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXIII |
Editors | Oswald H. Siegmund, Keri Hoadley |
Publisher | SPIE |
ISBN (Electronic) | 9781510665705 |
DOIs | |
State | Published - 2023 |
Event | UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXIII 2023 - San Diego, United States Duration: Aug 20 2023 → Aug 22 2023 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 12678 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXIII 2023 |
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Country/Territory | United States |
City | San Diego |
Period | 8/20/23 → 8/22/23 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering