TY - GEN
T1 - P1-31
T2 - 23rd International Vacuum Nanoelectronics Conference, IVNC 2010
AU - Chung, Moon S.
AU - Mayer, Alexander
AU - Weiss, Brock L.
AU - Miskovsky, Nicholas M.
AU - Cutler, Paul H.
PY - 2010/10/29
Y1 - 2010/10/29
N2 - We have investigated the enhanced field emission observed at the contact between metal and dielectric. To describe the dielectric effect on the enhancement, we consider a two-dimensional quadruple junction consisted of metal, vacuum, dielectric, and vacuum. It is found that both field and field emission are more enhanced in the quadruple junction than in the triple junction. The enhanced field can be strong enough to produce space charges in dielectric, which yields a favorable detour trajectory of field electrons.
AB - We have investigated the enhanced field emission observed at the contact between metal and dielectric. To describe the dielectric effect on the enhancement, we consider a two-dimensional quadruple junction consisted of metal, vacuum, dielectric, and vacuum. It is found that both field and field emission are more enhanced in the quadruple junction than in the triple junction. The enhanced field can be strong enough to produce space charges in dielectric, which yields a favorable detour trajectory of field electrons.
UR - http://www.scopus.com/inward/record.url?scp=77958509546&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77958509546&partnerID=8YFLogxK
U2 - 10.1109/IVNC.2010.5563167
DO - 10.1109/IVNC.2010.5563167
M3 - Conference contribution
AN - SCOPUS:77958509546
SN - 9781424478873
T3 - 23rd International Vacuum Nanoelectronics Conference, IVNC 2010
SP - 84
EP - 85
BT - 23rd International Vacuum Nanoelectronics Conference, IVNC 2010
Y2 - 26 July 2010 through 30 July 2010
ER -