Parameter extraction and electrical characterization of high density connector using time domain measurements

Sreemala Pannala; Anand Haridass; Madhavan Swaminathan

doi:10.1109/6040.746540

Parameter extraction and electrical characterization of high density connector using time domain measurements

Sreemala Pannala, Anand Haridass, Madhavan Swaminathan

Electrical Engineering

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

-This paper discusses the parameter extraction and electrical characterization of a high density connector system using time domain measurements. Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using cross talk measurements.

Original language	English (US)
Pages (from-to)	32-39
Number of pages	8
Journal	IEEE Transactions on Advanced Packaging
Volume	22
Issue number	1
DOIs	https://doi.org/10.1109/6040.746540
State	Published - 1999

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1109/6040.746540

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title = "Parameter extraction and electrical characterization of high density connector using time domain measurements",

abstract = "-This paper discusses the parameter extraction and electrical characterization of a high density connector system using time domain measurements. Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using cross talk measurements.",

author = "Sreemala Pannala and Anand Haridass and Madhavan Swaminathan",

note = "Funding Information: Manuscript received August 1, 1997; revised September 10, 1998. This work was supported by the Panda Project through the School of Electrical and Computer Engineering, Georgia Institute of Technology, under Contract Number E21-Z96.",

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AU - Pannala, Sreemala

AU - Haridass, Anand

AU - Swaminathan, Madhavan

N1 - Funding Information: Manuscript received August 1, 1997; revised September 10, 1998. This work was supported by the Panda Project through the School of Electrical and Computer Engineering, Georgia Institute of Technology, under Contract Number E21-Z96.

PY - 1999

Y1 - 1999

N2 - -This paper discusses the parameter extraction and electrical characterization of a high density connector system using time domain measurements. Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using cross talk measurements.

AB - -This paper discusses the parameter extraction and electrical characterization of a high density connector system using time domain measurements. Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using cross talk measurements.

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Parameter extraction and electrical characterization of high density connector using time domain measurements

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