TY - JOUR
T1 - Partial Order-Disorder Transition Driving Closure of Band Gap
T2 - Example of Thermoelectric Clathrates
AU - Troppenz, Maria
AU - Rigamonti, Santiago
AU - Sofo, Jorge O.
AU - Draxl, Claudia
N1 - Funding Information:
M. T. acknowledges funding from the Elsa-Neumann Stiftung Berlin. We thank Oleg Rubel for drawing our attention to Refs. .
Publisher Copyright:
© 2023 American Physical Society.
PY - 2023/4/21
Y1 - 2023/4/21
N2 - In the quest for efficient thermoelectrics, semiconducting behavior is a targeted property. Yet, this is often difficult to achieve due to the complex interplay between electronic structure, temperature, and disorder. We find this to be the case for the thermoelectric clathrate Ba8Al16Si30: Although this material exhibits a band gap in its ground state, a temperature-driven partial order-disorder transition leads to its effective closing. This finding is enabled by a novel approach to calculate the temperature-dependent effective band structure of alloys. Our method fully accounts for the effects of short-range order and can be applied to complex alloys with many atoms in the primitive cell, without relying on effective medium approximations.
AB - In the quest for efficient thermoelectrics, semiconducting behavior is a targeted property. Yet, this is often difficult to achieve due to the complex interplay between electronic structure, temperature, and disorder. We find this to be the case for the thermoelectric clathrate Ba8Al16Si30: Although this material exhibits a band gap in its ground state, a temperature-driven partial order-disorder transition leads to its effective closing. This finding is enabled by a novel approach to calculate the temperature-dependent effective band structure of alloys. Our method fully accounts for the effects of short-range order and can be applied to complex alloys with many atoms in the primitive cell, without relying on effective medium approximations.
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U2 - 10.1103/PhysRevLett.130.166402
DO - 10.1103/PhysRevLett.130.166402
M3 - Article
C2 - 37154653
AN - SCOPUS:85153887537
SN - 0031-9007
VL - 13
JO - Physical review letters
JF - Physical review letters
IS - 16
M1 - 166402
ER -