TY - JOUR
T1 - Pd and Au Contacts to SnS
T2 - Thermodynamic Predictions and Annealing Study
AU - Gurunathan, Ramya L.
AU - Nasr, Joseph
AU - Cordell, Jacob J.
AU - Banai, Rona A.
AU - Abraham, Michael
AU - Cooley, Kayla A.
AU - Horn, Mark
AU - Mohney, Suzanne E.
N1 - Publisher Copyright:
© 2016, The Minerals, Metals & Materials Society.
Copyright:
Copyright 2016 Elsevier B.V., All rights reserved.
PY - 2016/12/1
Y1 - 2016/12/1
N2 - Tin(II) sulfide (SnS) is emerging as an attractive p-type absorber layer material for thin film photovoltaics, which motivates the search for Ohmic, low-resistance contacts for SnS. In this study, Pd and Au contacts were prepared on sputter-deposited SnS films and electrically characterized both as-deposited and after annealing of the contacts. Ternary phase diagrams were also calculated to help predict whether the chosen metals would react with the SnS film. Pd was expected to react with the SnS film, while Au was expected to be in thermodynamic equilibrium. The Pd contacts appeared reactive, and their resistance was minimized with post-deposition annealing at 400°C, while the Au contacts showed little change upon annealing and remained unreactive.
AB - Tin(II) sulfide (SnS) is emerging as an attractive p-type absorber layer material for thin film photovoltaics, which motivates the search for Ohmic, low-resistance contacts for SnS. In this study, Pd and Au contacts were prepared on sputter-deposited SnS films and electrically characterized both as-deposited and after annealing of the contacts. Ternary phase diagrams were also calculated to help predict whether the chosen metals would react with the SnS film. Pd was expected to react with the SnS film, while Au was expected to be in thermodynamic equilibrium. The Pd contacts appeared reactive, and their resistance was minimized with post-deposition annealing at 400°C, while the Au contacts showed little change upon annealing and remained unreactive.
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U2 - 10.1007/s11664-016-5042-z
DO - 10.1007/s11664-016-5042-z
M3 - Article
AN - SCOPUS:84992168485
SN - 0361-5235
VL - 45
SP - 6300
EP - 6304
JO - Journal of Electronic Materials
JF - Journal of Electronic Materials
IS - 12
ER -