Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling
- Sokrates T. Pantelides
- , L. Tsetseris
- , M. J. Beck
- , S. N. Rashkeev
- , G. Hadjisavvas
- , I. G. Batyrev
- , Blair Richard Tuttle
- , A. G. Marinopoulos
- , X. J. Zhou
- , D. M. Fleetwood
- , R. D. Schrimpf
Research output: Contribution to journal › Article › peer-review
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