Phase-field model of domain structures in ferroelectric thin films

Y. L. Li; S. Y. Hu; Z. K. Liu; L. Q. Chen

doi:10.1063/1.1377855

Phase-field model of domain structures in ferroelectric thin films

Y. L. Li, S. Y. Hu, Z. K. Liu, L. Q. Chen

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289 Scopus citations

Abstract

A phase-field model for predicting the coherent microstructure evolution in constrained thin films is developed. It employs an analytical elastic solution derived for a constrained film with arbitrary eigenstrain distributions. The domain structure evolution during a cubic→tetragonal proper ferroelectric phase transition is studied. It is shown that the model is able to simultaneously predict the effects of substrate constraint and temperature on the volume fractions of domain variants, domain-wall orientations, domain shapes, and their temporal evolution.

Original language	English (US)
Pages (from-to)	3878-3880
Number of pages	3
Journal	Applied Physics Letters
Volume	78
Issue number	24
DOIs	https://doi.org/10.1063/1.1377855
State	Published - Jun 11 2001

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1377855

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abstract = "A phase-field model for predicting the coherent microstructure evolution in constrained thin films is developed. It employs an analytical elastic solution derived for a constrained film with arbitrary eigenstrain distributions. The domain structure evolution during a cubic→tetragonal proper ferroelectric phase transition is studied. It is shown that the model is able to simultaneously predict the effects of substrate constraint and temperature on the volume fractions of domain variants, domain-wall orientations, domain shapes, and their temporal evolution.",

author = "Li, {Y. L.} and Hu, {S. Y.} and Liu, {Z. K.} and Chen, {L. Q.}",

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Phase-field model of domain structures in ferroelectric thin films

Abstract

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