Phase-field model of domain structures in ferroelectric thin films

Y. L. Li, S. Y. Hu, Z. K. Liu, L. Q. Chen

Research output: Contribution to journalArticlepeer-review

289 Scopus citations


A phase-field model for predicting the coherent microstructure evolution in constrained thin films is developed. It employs an analytical elastic solution derived for a constrained film with arbitrary eigenstrain distributions. The domain structure evolution during a cubic→tetragonal proper ferroelectric phase transition is studied. It is shown that the model is able to simultaneously predict the effects of substrate constraint and temperature on the volume fractions of domain variants, domain-wall orientations, domain shapes, and their temporal evolution.

Original languageEnglish (US)
Pages (from-to)3878-3880
Number of pages3
JournalApplied Physics Letters
Issue number24
StatePublished - Jun 11 2001

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


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