Keyphrases
Applied Bias
33%
Applied Electric Field
16%
Bound Charges
16%
Charged Interface
100%
Defect Distribution
16%
Dislocation
16%
Domain Structure
16%
Domain Wall Motion
16%
Domain Walls
50%
Epitaxial
33%
Ferroelastic Domain Structure
16%
Ferroelastic Domains
66%
Ferroelectric Domain Walls
16%
Ferroelectric Switching
100%
Ferroelectric Thin Film
16%
Grain Boundary
16%
High-resolution Transmission Electron Microscopy (HRTEM)
16%
Interface Formation
100%
Local Processes
16%
Phase-field Model
100%
Polarization Direction
16%
Spatial Distribution
16%
Engineering
Applied Electric Field
20%
Broadening
20%
Defects
20%
Domain Structure
40%
Domain Wall
100%
Grain Boundary
20%
High Resolution
20%
Phase Field
100%
Polarization Direction
20%
Spatial Distribution
20%
Thin Films
80%
Transmissions
20%
Material Science
Domain Wall
83%
Ferroelectric Material
100%
Ferroelectric Thin Films
16%
Film
16%
Grain Boundary
16%
High-Resolution Transmission Electron Microscopy
16%
Thin Films
50%