Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns

Rona E. Banai; Hyeonseok Lee; Sivan Zlotnikov; Jeffrey R.S. Brownson; Mark W. Horn

doi:10.1109/PVSC.2013.6744997

Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns

Rona E. Banai
, Hyeonseok Lee
, Sivan Zlotnikov
, Jeffrey R.S. Brownson
, Mark W. Horn

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Scopus citations

Abstract

Tin monosulfide (SnS) is a promising material for a photovoltaic absorber layer. Significant strides have been taken to better understand its material properties. The X-ray diffraction patterns of radio-frequency sputtered SnS thin films are investigated. Samples were deposited under varying total pressure, target power, substrate-to-target distance, and substrate temperature. Rietveld refinement of samples deposited under varying conditions yielded evidence of multiple phases present in SnS thin films. Refinements were completed with one or more tin sulfide phases, showing a dominant herzenbergite SnS phase (Pbnm). Possible secondary phases include orthrhombic (Cmcm) and cubic (Fm3m) crystal structures. Lattice parameters, cell volume, and unit cell density were investigated as a function of deposition conditions. Results indicate that growth mode is related to deposition rate. Early studies of heated stage depositions showed that SnS thin films have added mobility at the substrate.

Original language	English (US)
Title of host publication	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	2562-2566
Number of pages	5
ISBN (Print)	9781479932993
DOIs	https://doi.org/10.1109/PVSC.2013.6744997
State	Published - 2013
Event	39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: Jun 16 2013 → Jun 21 2013

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Other

Other	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/Territory	United States
City	Tampa, FL
Period	6/16/13 → 6/21/13

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

All Science Journal Classification (ASJC) codes

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2013.6744997

Cite this

Banai, R. E., Lee, H., Zlotnikov, S., Brownson, J. R. S., & Horn, M. W. (2013). Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 (pp. 2562-2566). Article 6744997 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2013.6744997

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title = "Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns",

abstract = "Tin monosulfide (SnS) is a promising material for a photovoltaic absorber layer. Significant strides have been taken to better understand its material properties. The X-ray diffraction patterns of radio-frequency sputtered SnS thin films are investigated. Samples were deposited under varying total pressure, target power, substrate-to-target distance, and substrate temperature. Rietveld refinement of samples deposited under varying conditions yielded evidence of multiple phases present in SnS thin films. Refinements were completed with one or more tin sulfide phases, showing a dominant herzenbergite SnS phase (Pbnm). Possible secondary phases include orthrhombic (Cmcm) and cubic (Fm3m) crystal structures. Lattice parameters, cell volume, and unit cell density were investigated as a function of deposition conditions. Results indicate that growth mode is related to deposition rate. Early studies of heated stage depositions showed that SnS thin films have added mobility at the substrate.",

author = "Banai, \{Rona E.\} and Hyeonseok Lee and Sivan Zlotnikov and Brownson, \{Jeffrey R.S.\} and Horn, \{Mark W.\}",

year = "2013",

doi = "10.1109/PVSC.2013.6744997",

language = "English (US)",

isbn = "9781479932993",

series = "Conference Record of the IEEE Photovoltaic Specialists Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "2562--2566",

booktitle = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013",

address = "United States",

note = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013 ; Conference date: 16-06-2013 Through 21-06-2013",

}

Banai, RE, Lee, H, Zlotnikov, S, Brownson, JRS & Horn, MW 2013, Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns. in 39th IEEE Photovoltaic Specialists Conference, PVSC 2013., 6744997, Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., pp. 2562-2566, 39th IEEE Photovoltaic Specialists Conference, PVSC 2013, Tampa, FL, United States, 6/16/13. https://doi.org/10.1109/PVSC.2013.6744997

Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns. / Banai, Rona E.; Lee, Hyeonseok; Zlotnikov, Sivan et al.
39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. p. 2562-2566 6744997 (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns

AU - Banai, Rona E.

AU - Lee, Hyeonseok

AU - Zlotnikov, Sivan

AU - Brownson, Jeffrey R.S.

AU - Horn, Mark W.

PY - 2013

Y1 - 2013

N2 - Tin monosulfide (SnS) is a promising material for a photovoltaic absorber layer. Significant strides have been taken to better understand its material properties. The X-ray diffraction patterns of radio-frequency sputtered SnS thin films are investigated. Samples were deposited under varying total pressure, target power, substrate-to-target distance, and substrate temperature. Rietveld refinement of samples deposited under varying conditions yielded evidence of multiple phases present in SnS thin films. Refinements were completed with one or more tin sulfide phases, showing a dominant herzenbergite SnS phase (Pbnm). Possible secondary phases include orthrhombic (Cmcm) and cubic (Fm3m) crystal structures. Lattice parameters, cell volume, and unit cell density were investigated as a function of deposition conditions. Results indicate that growth mode is related to deposition rate. Early studies of heated stage depositions showed that SnS thin films have added mobility at the substrate.

AB - Tin monosulfide (SnS) is a promising material for a photovoltaic absorber layer. Significant strides have been taken to better understand its material properties. The X-ray diffraction patterns of radio-frequency sputtered SnS thin films are investigated. Samples were deposited under varying total pressure, target power, substrate-to-target distance, and substrate temperature. Rietveld refinement of samples deposited under varying conditions yielded evidence of multiple phases present in SnS thin films. Refinements were completed with one or more tin sulfide phases, showing a dominant herzenbergite SnS phase (Pbnm). Possible secondary phases include orthrhombic (Cmcm) and cubic (Fm3m) crystal structures. Lattice parameters, cell volume, and unit cell density were investigated as a function of deposition conditions. Results indicate that growth mode is related to deposition rate. Early studies of heated stage depositions showed that SnS thin films have added mobility at the substrate.

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DO - 10.1109/PVSC.2013.6744997

M3 - Conference contribution

AN - SCOPUS:84896474174

SN - 9781479932993

T3 - Conference Record of the IEEE Photovoltaic Specialists Conference

SP - 2562

EP - 2566

BT - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

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T2 - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

Y2 - 16 June 2013 through 21 June 2013

ER -

Banai RE, Lee H, Zlotnikov S, Brownson JRS, Horn MW. Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. Institute of Electrical and Electronics Engineers Inc. 2013. p. 2562-2566. 6744997. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2013.6744997

Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns

Abstract

Publication series

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UN SDGs

All Science Journal Classification (ASJC) codes

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