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Phase identification of RF-sputtered SnS thin films using rietveld analysis of X-ray diffraction patterns

  • Rona E. Banai
  • , Hyeonseok Lee
  • , Sivan Zlotnikov
  • , Jeffrey R.S. Brownson
  • , Mark W. Horn

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9   Link opens in a new tab Scopus citations

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