Abstract
Atomic force microscopy (AFM), neutron reflection (NR) and secondary ion mass spectroscopy (SIMS) are used to examine phase separation in symmetrically segregating thin polymer blend films (≤1000 Å). Phase separation in the film leads to undulations of the liquid-air interface, provided the film is sufficiently thin to suppress surface-directed spinodal decomposition waves. Flattened droplets are formed at a very late stage of phase separation, and the aspect ratio of these droplets can be rationalized by an interfacial free energy minimization argument.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 857-862 |
| Number of pages | 6 |
| Journal | Macromolecules |
| Volume | 31 |
| Issue number | 3 |
| DOIs | |
| State | Published - Feb 10 1998 |
All Science Journal Classification (ASJC) codes
- Organic Chemistry
- Polymers and Plastics
- Inorganic Chemistry
- Materials Chemistry