Phase-separation-induced surface patterns in thin polymer blend films

A. Karim; T. M. Slawecki; S. K. Kumar; J. F. Douglas; S. K. Satija; C. C. Han; T. P. Russell; Y. Liu; R. Overney; J. Sokolov; M. H. Rafailovich

doi:10.1021/ma970687g

Phase-separation-induced surface patterns in thin polymer blend films

A. Karim
, T. M. Slawecki
, S. K. Kumar
, J. F. Douglas
, S. K. Satija
, C. C. Han
, T. P. Russell
, Y. Liu
, R. Overney
, J. Sokolov
, M. H. Rafailovich

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

198 Scopus citations

Abstract

Atomic force microscopy (AFM), neutron reflection (NR) and secondary ion mass spectroscopy (SIMS) are used to examine phase separation in symmetrically segregating thin polymer blend films (≤1000 Å). Phase separation in the film leads to undulations of the liquid-air interface, provided the film is sufficiently thin to suppress surface-directed spinodal decomposition waves. Flattened droplets are formed at a very late stage of phase separation, and the aspect ratio of these droplets can be rationalized by an interfacial free energy minimization argument.

Original language	English (US)
Pages (from-to)	857-862
Number of pages	6
Journal	Macromolecules
Volume	31
Issue number	3
DOIs	https://doi.org/10.1021/ma970687g
State	Published - Feb 10 1998

All Science Journal Classification (ASJC) codes

Organic Chemistry
Polymers and Plastics
Inorganic Chemistry
Materials Chemistry

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10.1021/ma970687g

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@article{4c3eec8ef546477dbabfd813a9fad518,

title = "Phase-separation-induced surface patterns in thin polymer blend films",

abstract = "Atomic force microscopy (AFM), neutron reflection (NR) and secondary ion mass spectroscopy (SIMS) are used to examine phase separation in symmetrically segregating thin polymer blend films (≤1000 {\AA}). Phase separation in the film leads to undulations of the liquid-air interface, provided the film is sufficiently thin to suppress surface-directed spinodal decomposition waves. Flattened droplets are formed at a very late stage of phase separation, and the aspect ratio of these droplets can be rationalized by an interfacial free energy minimization argument.",

author = "A. Karim and Slawecki, \{T. M.\} and Kumar, \{S. K.\} and Douglas, \{J. F.\} and Satija, \{S. K.\} and Han, \{C. C.\} and Russell, \{T. P.\} and Y. Liu and R. Overney and J. Sokolov and Rafailovich, \{M. H.\}",

year = "1998",

month = feb,

day = "10",

doi = "10.1021/ma970687g",

language = "English (US)",

volume = "31",

pages = "857--862",

journal = "Macromolecules",

issn = "0024-9297",

publisher = "American Chemical Society",

number = "3",

}

TY - JOUR

T1 - Phase-separation-induced surface patterns in thin polymer blend films

AU - Karim, A.

AU - Slawecki, T. M.

AU - Kumar, S. K.

AU - Douglas, J. F.

AU - Satija, S. K.

AU - Han, C. C.

AU - Russell, T. P.

AU - Liu, Y.

AU - Overney, R.

AU - Sokolov, J.

AU - Rafailovich, M. H.

PY - 1998/2/10

Y1 - 1998/2/10

N2 - Atomic force microscopy (AFM), neutron reflection (NR) and secondary ion mass spectroscopy (SIMS) are used to examine phase separation in symmetrically segregating thin polymer blend films (≤1000 Å). Phase separation in the film leads to undulations of the liquid-air interface, provided the film is sufficiently thin to suppress surface-directed spinodal decomposition waves. Flattened droplets are formed at a very late stage of phase separation, and the aspect ratio of these droplets can be rationalized by an interfacial free energy minimization argument.

AB - Atomic force microscopy (AFM), neutron reflection (NR) and secondary ion mass spectroscopy (SIMS) are used to examine phase separation in symmetrically segregating thin polymer blend films (≤1000 Å). Phase separation in the film leads to undulations of the liquid-air interface, provided the film is sufficiently thin to suppress surface-directed spinodal decomposition waves. Flattened droplets are formed at a very late stage of phase separation, and the aspect ratio of these droplets can be rationalized by an interfacial free energy minimization argument.

UR - https://www.scopus.com/pages/publications/0032003118

UR - https://www.scopus.com/pages/publications/0032003118#tab=citedBy

U2 - 10.1021/ma970687g

DO - 10.1021/ma970687g

M3 - Article

AN - SCOPUS:0032003118

SN - 0024-9297

VL - 31

SP - 857

EP - 862

JO - Macromolecules

JF - Macromolecules

IS - 3

ER -

Phase-separation-induced surface patterns in thin polymer blend films

Abstract

All Science Journal Classification (ASJC) codes

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