Abstract
We summarize and extend our previous study of multilayer film adsorption on planar surfaces. The density profile of the adsorbed film is studied by a mean-field approximation. This leads to a self-consistent potential and a correction in thickness prediction to the result of Lifshitz and co-workers. The correction is determined by the van der Waals interaction and film compressibility and is found to be important for He films. A simple model is presented also for the physisorption isotherm inside a cylindrical pore. Comparisons with experimental data are provided.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 616-625 |
| Number of pages | 10 |
| Journal | Langmuir |
| Volume | 5 |
| Issue number | 3 |
| DOIs | |
| State | Published - May 1 1989 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Surfaces and Interfaces
- Spectroscopy
- Electrochemistry