TY - GEN
T1 - Piezoelectric RF MEMS switches and phase ShiftersÜ
AU - Polcawich, Ron
AU - Judy, Daniel
AU - Pulskamp, Jeffrey
AU - Trolier-McKinstry, Susan
AU - Dubey, Madan
PY - 2008
Y1 - 2008
N2 - Piezoelectric thin films were utilized to actuate cantilevers for a radio frequency (RF) microelectromechanical system (MEMS) switches. Using lead zirconate titanate (PZT) thin films, an RF MEMS series switch was designed and fabricated.Ü The switch operates from -25..-C to 100 ..-C with no change in actuation voltage of 9V.Ü The switch isolation is better than -20 dB and the insertion loss (-S21) less than 0.5 dB from DC to 40 GHz.Ü In addition to improvements in switch performance, a 17 GHz, 2-bit reflection phase shifter has been demonstrated using PZT shunt switches operating at 15 V.Ü Each of the 4 phase states are demonstrated with minimal phase error and an average insertion loss of 6.8 dB with a high of 8 dB for the longest phase state (limited by substrate losses highlighted in our previous work).Ü Correcting the substrate loss reduces the insertion loss of the long phase state to less than 2 dB.
AB - Piezoelectric thin films were utilized to actuate cantilevers for a radio frequency (RF) microelectromechanical system (MEMS) switches. Using lead zirconate titanate (PZT) thin films, an RF MEMS series switch was designed and fabricated.Ü The switch operates from -25..-C to 100 ..-C with no change in actuation voltage of 9V.Ü The switch isolation is better than -20 dB and the insertion loss (-S21) less than 0.5 dB from DC to 40 GHz.Ü In addition to improvements in switch performance, a 17 GHz, 2-bit reflection phase shifter has been demonstrated using PZT shunt switches operating at 15 V.Ü Each of the 4 phase states are demonstrated with minimal phase error and an average insertion loss of 6.8 dB with a high of 8 dB for the longest phase state (limited by substrate losses highlighted in our previous work).Ü Correcting the substrate loss reduces the insertion loss of the long phase state to less than 2 dB.
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U2 - 10.1109/ISAF.2008.4693746
DO - 10.1109/ISAF.2008.4693746
M3 - Conference contribution
AN - SCOPUS:58149524850
SN - 1424427444
SN - 9781424427444
T3 - IEEE International Symposium on Applications of Ferroelectrics
BT - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
T2 - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
Y2 - 23 February 2008 through 28 February 2008
ER -