Plasmonic internal photoemission for accurate device in situ measurement of metal-organic semiconductor injection barriers

Keyphrases

• In Situ Measurements 100%
• Plasmonics 100%
• Internal Photoemission 100%
• Injection Barrier 100%
• Current Injection 60%
• Interface State Density 40%
• Density of States 40%
• Energy Barrier 40%
• Resonant Coupling 40%
• Photoconductivity 40%
• Organic Electronic Devices 40%
• Thin-film Photovoltaics 20%
• Direct Measurement 20%
• Low Field 20%
• Surface Treatment 20%
• Organic Semiconductors 20%
• Interface States 20%
• Plasmon 20%
• Thin-film Transistors 20%
• Field Injection 20%
• Injection Process 20%
• Organic Thin Films 20%
• Organic Light-emitting Diodes 20%
• Metal Contact 20%
• Organic Devices 20%
• State Distribution 20%
• Operational Lifetime 20%

Engineering

• Situ Measurement 100%
• Plasmonics 100%
• Photoemission 100%
• Organic Semiconductor 100%
• Current Injection 60%
• Thin Films 40%
• Energy Barrier 40%
• Organic Electronics 40%
• Photovoltaics 20%
• Interface State 20%
• Semiconductor Device 20%
• Injection Process 20%
• Thin-Film Transistor 20%
• Substantial Increase 20%
• Organic Light-Emitting Diode 20%
• Metal Contact 20%

Material Science

• Density 100%
• Thin Films 100%
• Photoconductivity 100%
• Photovoltaics 50%
• Light-Emitting Diode 50%
• Thin-Film Transistor 50%
• Surface Plasmon 50%
• Semiconductor Device 50%
• Surface Treatment 50%