Polarity characterization by anomalous x-ray dispersion of ZnO films and GaN lateral polar structures

Christopher T. Shelton, Edward Sachet, Elizabeth A. Paisley, Marc P. Hoffmann, Joseph Rajan, Ramón Collazo, Zlatko Sitar, Jon Paul Maria

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Polarity characterization by anomalous x-ray dispersion of ZnO films and GaN lateral polar structures'. Together they form a unique fingerprint.

Physics & Astronomy