Polycrystalline silicon optical fibers with atomically smooth surfaces

Noel Healy, Laura Lagonigro, Justin R. Sparks, Stuart Boden, Pier J.A. Sazio, John V. Badding, Anna C. Peacock

Research output: Contribution to journalArticlepeer-review

23 Scopus citations


We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the corëCcladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ∼0:1nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications.

Original languageEnglish (US)
Pages (from-to)2480-2482
Number of pages3
JournalOptics Letters
Issue number13
StatePublished - Jul 1 2011

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics


Dive into the research topics of 'Polycrystalline silicon optical fibers with atomically smooth surfaces'. Together they form a unique fingerprint.

Cite this