Abstract
We investigate the surface roughness of polycrystalline silicon core optical fibers fabricated using a high-pressure chemical deposition technique. By measuring the optical transmission of two fibers with different core sizes, we will show that scattering from the corëCcladding interface has a negligible effect on the losses. A Zemetrics ZeScope three-dimensional optical profiler has been used to directly measure the surface of the core material, confirming a roughness of only ∼0:1nm. The ability to fabricate low-loss polysilicon optical fibers with ultrasmooth cores scalable to submicrometer dimensions should establish their use in a range of nonlinear optical applications.
Original language | English (US) |
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Pages (from-to) | 2480-2482 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 36 |
Issue number | 13 |
DOIs | |
State | Published - Jul 1 2011 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics