Polymethylmethacrylate by XPS

Scott W. Rosencrance; Wayne K. Way; Nicholas Winograd; David A. Shirley

doi:10.1116/1.1247740

Polymethylmethacrylate by XPS

Scott W. Rosencrance
, Wayne K. Way
, Nicholas Winograd
, David A. Shirley

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

X-ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.

Original language	English (US)
Pages (from-to)	71-75
Number of pages	5
Journal	Surface Science Spectra
Volume	2
Issue number	1
DOIs	https://doi.org/10.1116/1.1247740
State	Published - Jan 1 1993

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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@article{8c6b14cbe201453296ad7cb7e547298b,

title = "Polymethylmethacrylate by XPS",

abstract = "X-ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2\% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.",

author = "Rosencrance, \{Scott W.\} and Way, \{Wayne K.\} and Nicholas Winograd and Shirley, \{David A.\}",

note = "Publisher Copyright: {\textcopyright} 1993 American Vacuum Society.",

year = "1993",

month = jan,

day = "1",

doi = "10.1116/1.1247740",

language = "English (US)",

volume = "2",

pages = "71--75",

journal = "Surface Science Spectra",

issn = "1055-5269",

publisher = "AVS Science and Technology Society",

number = "1",

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TY - JOUR

T1 - Polymethylmethacrylate by XPS

AU - Rosencrance, Scott W.

AU - Way, Wayne K.

AU - Winograd, Nicholas

AU - Shirley, David A.

PY - 1993/1/1

Y1 - 1993/1/1

N2 - X-ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.

AB - X-ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.

UR - https://www.scopus.com/pages/publications/0011331852

UR - https://www.scopus.com/pages/publications/0011331852#tab=citedBy

U2 - 10.1116/1.1247740

DO - 10.1116/1.1247740

M3 - Article

AN - SCOPUS:0011331852

SN - 1055-5269

VL - 2

SP - 71

EP - 75

JO - Surface Science Spectra

JF - Surface Science Spectra

IS - 1

ER -

Polymethylmethacrylate by XPS

Abstract

All Science Journal Classification (ASJC) codes

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