Polynomial Time Testability of Circuits Generated by Input Decomposition

Mathematics

• Polynomial time 100%
• Fault 97%
• Decompose 80%
• Test Generation 74%
• Logic Synthesis 35%
• Fault Detection 32%
• Line 27%
• Test Set 27%
• Justification 21%
• Eliminate 20%
• Propagation 19%
• Polynomial-time Algorithm 18%
• Tables 18%
• Presentation 17%
• Strategy 14%
• Model 6%
• Class 6%

Engineering & Materials Science

• Polynomials 96%
• Decomposition 90%
• Networks (circuits) 69%
• Logic Synthesis 33%
• Combinatorial circuits 32%
• Fault detection 23%
• Set theory 16%