Polystyrene by XPS

Wayne K. Way, Scott W. Rosencrance, Nicholas Winograd, David A. Shirley

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


X-ray photoelectron spectroscopy was used to analyze a thin film of polystyrene. Spin casting from a 2% by weight solution of polystyrene in toluene was utilized. Film thickness was determined to be 60 nm by ellipsometry. The thin film was examined with a Hewlett Packard 5950A ESCA spectrometer.

Original languageEnglish (US)
Pages (from-to)67-70
Number of pages4
JournalSurface Science Spectra
Issue number1
StatePublished - Jan 1 1993

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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