Abstract
X-ray photoelectron spectroscopy was used to analyze a thin film of polystyrene. Spin casting from a 2% by weight solution of polystyrene in toluene was utilized. Film thickness was determined to be 60 nm by ellipsometry. The thin film was examined with a Hewlett Packard 5950A ESCA spectrometer.
Original language | English (US) |
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Pages (from-to) | 67-70 |
Number of pages | 4 |
Journal | Surface Science Spectra |
Volume | 2 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1 1993 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films