TY - JOUR
T1 - Preparation and characterization of ultrathin free-standing carbon films
AU - Lee, Hoikwan
AU - Rajagopalan, Ramakrishnan
PY - 2013
Y1 - 2013
N2 - Ultrathin free-standing carbon films with thicknesses of ∼8-14 nm were prepared by peeling from glass after pyrolization of the polyfurfuryl alcohol precursor at 700 °C. The carbon films were characterized by using optical profilometry, confocal Raman spectroscopy, transmission electron microscopy, UV-vis spectroscopy, and a two-point probe I - V station measurement. The results confirmed the formation of ultrathin free-standing carbon films with a polyaromatic domain structure. Those films had up to a 90% transmittance with respect to air and had an ohmic behavior. In this work, we also suggest that the most likely peeling mechanism of carbon films results from glass corrosion.
AB - Ultrathin free-standing carbon films with thicknesses of ∼8-14 nm were prepared by peeling from glass after pyrolization of the polyfurfuryl alcohol precursor at 700 °C. The carbon films were characterized by using optical profilometry, confocal Raman spectroscopy, transmission electron microscopy, UV-vis spectroscopy, and a two-point probe I - V station measurement. The results confirmed the formation of ultrathin free-standing carbon films with a polyaromatic domain structure. Those films had up to a 90% transmittance with respect to air and had an ohmic behavior. In this work, we also suggest that the most likely peeling mechanism of carbon films results from glass corrosion.
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U2 - 10.3938/jkps.63.1859
DO - 10.3938/jkps.63.1859
M3 - Letter
AN - SCOPUS:84891091043
SN - 0374-4884
VL - 63
SP - 1859
EP - 1863
JO - Journal of the Korean Physical Society
JF - Journal of the Korean Physical Society
IS - 10
ER -