Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

Q. M. Ramasse, N. Alem, O. V. Yazyev, A. Zettl, C. T. Pan, R. R. Nair, R. Jalil, R. Zan, U. Bangert, C. R. Seabourne, A. J. Scott, K. S. Novoselov

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1526-1527
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberS2
StatePublished - Jul 2012

All Science Journal Classification (ASJC) codes

  • Instrumentation

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