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Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS

  • Q. M. Ramasse
  • , N. Alem
  • , O. V. Yazyev
  • , A. Zettl
  • , C. T. Pan
  • , R. R. Nair
  • , R. Jalil
  • , R. Zan
  • , U. Bangert
  • , C. R. Seabourne
  • , A. J. Scott
  • , K. S. Novoselov

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1526-1527
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
StatePublished - Jul 2012

All Science Journal Classification (ASJC) codes

  • Instrumentation

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