Process Challenge in Analog Computing Hardware using Phase Change Memory (PCM)

Victor Chan, I. Ok, S. Choi, T. Gordon, N. Arnold, I. Saraf, S. McDermott, K. Brew, T. Philip, H. Utomo, W. T. Tseng, C. Silvestre, N. Li, J. Li, J. Demarest, J. P. Han, A. Gasasira, R. Pujari, N. Saulnier, S. TeehanIshtiaq Ahsan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We discuss the process challenges such as the heater geometry effect, heater patterning processes and deep via formation. Based on the electrical data, we improve the processes and Phase Change memory (PCM) resistance distribution to meet Analog Computing requirement.

Original languageEnglish (US)
Title of host publication2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665456395
DOIs
StatePublished - 2023
Event34th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2023 - Saratoga Springs, United States
Duration: May 1 2023May 4 2023

Publication series

NameASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
Volume2023-May
ISSN (Print)1078-8743

Conference

Conference34th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2023
Country/TerritoryUnited States
CitySaratoga Springs
Period5/1/235/4/23

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • General Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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