Abstract
In a typical semiconductor manufacturing process, within-run (or batch) variation is usually controlled by automatic controllers built into the equipment. Batch sizes may be as small as one wafer in some processes. A run-to-run (R2R) controller is necessary since specifications can change from batch to batch, the equipment may experience aging or wearing-out phenomena, maintenance operations can change the operating conditions of the process, or process disturbances may enter the system suddenly. This implies that equipment controllers cannot be kept operating at a fixed recipe. Thus, an R2R controller is needed to act as a supervisor, indicating whether a recipe change is needed and suggesting a new recipe for use in the next batch.
Original language | English (US) |
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Title of host publication | Run-to-Run Control in Semiconductor Manufacturing |
Publisher | CRC Press |
Pages | 45-63 |
Number of pages | 19 |
ISBN (Electronic) | 9781420040661 |
ISBN (Print) | 0849311780, 9780849311789 |
State | Published - Jan 1 2000 |
All Science Journal Classification (ASJC) codes
- Engineering(all)