Process Design Kit and Design Automation for Flexible Hybrid Electronics

Tsung Ching Huang, Ting Lei, Leilai Shao, Sridhar Sivapurapu, Madhavan Swaminathan, Sicheng Li, Zhenan Bao, Kwang Ting Cheng, Raymond Beausoleil

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

High-performance low-cost flexible hybrid electronics (FHE) are desirable for internet of things (IoT). Carbon-nanotube (CNT) thin-film transistor (TFT) is a promising candidate for high-performance FHE because of its high carrier mobility (25cm2/V.s), superior mechanical flexibility/stretchability, and material compatibility with low-cost printing and solution processes. Flexible sensors and peripheral CNT-TFT circuits, such as decoders, drivers and sense amplifiers, can be printed and integrated with thinned (<50μm) silicon chips on soft, thin, and flexible substrates for appealing product designs and form factors. Here we report: 1) process design kit (PDK) to enable FHE design automation, from device modeling to physical verification, and 2) open-source and solution-process proven intellectual property (IP) blocks, including Pseudo-CMOS [1] digital logic and analog amplifiers on flexible substrates, as shown in Figure 1. The proposed FHE-PDK and circuit design IP are fully compatible with silicon design EDA tools, and can be readily used for co-design with both CNT-TFT circuits and silicon chips.

Original languageEnglish (US)
Title of host publicationProceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages36-41
Number of pages6
ISBN (Electronic)9783981926323
DOIs
StatePublished - May 14 2019
Event22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 - Florence, Italy
Duration: Mar 25 2019Mar 29 2019

Publication series

NameProceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019

Conference

Conference22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
Country/TerritoryItaly
CityFlorence
Period3/25/193/29/19

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Control and Optimization

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