Process-oriented basis representations for statistical process control (SPC)

David R. Gonzalez-Barreto; Russell R. Barton

Process-oriented basis representations for statistical process control (SPC)

David R. Gonzalez-Barreto, Russell R. Barton

Research output: Contribution to conference › Paper › peer-review

Abstract

This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

Original language	English (US)
Pages	954-958
Number of pages	5
State	Published - Dec 1 1995
Event	Proceedings of the 1995 4th Industrial Engineering Research Conference - Nashville, TN, USA Duration: May 24 1995 → May 25 1995

Other

Other	Proceedings of the 1995 4th Industrial Engineering Research Conference
City	Nashville, TN, USA
Period	5/24/95 → 5/25/95

All Science Journal Classification (ASJC) codes

Industrial and Manufacturing Engineering

Cite this

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title = "Process-oriented basis representations for statistical process control (SPC)",

abstract = "This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.",

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year = "1995",

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note = "Proceedings of the 1995 4th Industrial Engineering Research Conference ; Conference date: 24-05-1995 Through 25-05-1995",

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AU - Gonzalez-Barreto, David R.

AU - Barton, Russell R.

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N2 - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

AB - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

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M3 - Paper

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SP - 954

EP - 958

T2 - Proceedings of the 1995 4th Industrial Engineering Research Conference

Y2 - 24 May 1995 through 25 May 1995

ER -

Process-oriented basis representations for statistical process control (SPC)

Abstract

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All Science Journal Classification (ASJC) codes

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