Process-oriented basis representations for statistical process control (SPC)

David R. Gonzalez-Barreto; Russell R. Barton

Process-oriented basis representations for statistical process control (SPC)

David R. Gonzalez-Barreto
, Russell R. Barton

Research output: Contribution to conference › Paper › peer-review

Abstract

This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

Original language	English (US)
Pages	954-958
Number of pages	5
State	Published - 1995
Event	Proceedings of the 1995 4th Industrial Engineering Research Conference - Nashville, TN, USA Duration: May 24 1995 → May 25 1995

Other

Other	Proceedings of the 1995 4th Industrial Engineering Research Conference
City	Nashville, TN, USA
Period	5/24/95 → 5/25/95

All Science Journal Classification (ASJC) codes

Industrial and Manufacturing Engineering

Cite this

@conference{953ed02fa5014b5695b6c7bbbc001604,

title = "Process-oriented basis representations for statistical process control (SPC)",

abstract = "This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.",

author = "Gonzalez-Barreto, \{David R.\} and Barton, \{Russell R.\}",

year = "1995",

language = "English (US)",

pages = "954--958",

note = "Proceedings of the 1995 4th Industrial Engineering Research Conference ; Conference date: 24-05-1995 Through 25-05-1995",

}

TY - CONF

T1 - Process-oriented basis representations for statistical process control (SPC)

AU - Gonzalez-Barreto, David R.

AU - Barton, Russell R.

PY - 1995

Y1 - 1995

N2 - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

AB - This paper proposes a new diagnostic approach for multivariate process measurement vectors using a process-oriented basis. Many potential production problems have characteristic signatures that can be detected in the multivariate quality vector. Each signature can be used as a basis element in the process-oriented. The representation of the multivariate variance or bias using this basis will identify a small set of potential causes, those associated with basis elements (signatures) with the largest coefficients.

UR - https://www.scopus.com/pages/publications/0029426062

UR - https://www.scopus.com/pages/publications/0029426062#tab=citedBy

M3 - Paper

AN - SCOPUS:0029426062

SP - 954

EP - 958

T2 - Proceedings of the 1995 4th Industrial Engineering Research Conference

Y2 - 24 May 1995 through 25 May 1995

ER -

Process-oriented basis representations for statistical process control (SPC)

Abstract

Other

All Science Journal Classification (ASJC) codes

Other files and links

Fingerprint

Cite this