Abstract
The operation of a run-to-run system usually takes places in two phases or stages. In the first stage, a new equipment is “qualified,” which means that experiments are conducted in order to find a recipe that optimizes the performance of the equipment. The qualification stage is based on design of experiments techniques and the use of a set of experimental optimization techniques called response surface methods.
| Original language | English (US) |
|---|---|
| Title of host publication | Run-to-Run Control in Semiconductor Manufacturing |
| Publisher | CRC Press |
| Pages | 219-228 |
| Number of pages | 10 |
| ISBN (Electronic) | 9781420040661 |
| ISBN (Print) | 0849311780, 9780849311789 |
| State | Published - Jan 1 2000 |
All Science Journal Classification (ASJC) codes
- General Engineering
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