Abstract
This paper reviews the literature on size effects in ferroelectric materials, with an emphasis on thin film perovskite ferroelectrics. The roles of boundary conditions, defect chemistry, electrode interfaces, surface layers, and microstructure in controlling the measured properties of ferroelectric films, as well as the observed deviation from bulk properties are discussed. Examples of the manifestation of size effects in terms of the low and high field dielectric properties, the piezoelectric effect, and the leakage behavior of films are given.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 263-298 |
| Number of pages | 36 |
| Journal | Annual Review of Materials Science |
| Volume | 30 |
| DOIs | |
| State | Published - 2000 |
All Science Journal Classification (ASJC) codes
- General Materials Science
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