Quantification of interfacial roughness of In2O3/ZrO2 superlattice films in 3D

X. Y. Zhong; B. Kabius; D. K. Schreiber; J. A. Eastman; D. D. Fong; A. K. Petford-Long

doi:10.1017/S1431927609098626

Quantification of interfacial roughness of In2O3/ZrO2 superlattice films in 3D

X. Y. Zhong, B. Kabius, D. K. Schreiber, J. A. Eastman, D. D. Fong, A. K. Petford-Long

Materials Research Institute (MRI)

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Original language	English (US)
Pages (from-to)	600-601
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609098626
State	Published - Jul 2009

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927609098626

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@article{215a52bb3ea74e68948ce8b516857a5c,

title = "Quantification of interfacial roughness of In2O3/ZrO2 superlattice films in 3D",

author = "Zhong, {X. Y.} and B. Kabius and Schreiber, {D. K.} and Eastman, {J. A.} and Fong, {D. D.} and Petford-Long, {A. K.}",

note = "Funding Information: References [1] L.J. Gauckler and K. Sasaki, Solid St. Ionics 75 (1995) 203. [2] This research was supported by the US Department of Energy, BES-Materials Sciences under contact number 58931 and 58932. This work was accomplished at the Electron Microscopy Center for Materials Research at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC. The help of Dr. Yuzi Liu and Jon Hiller at Argonne National Laboratory and Dr. Fang Lin at South China Agricultural University are gratefully acknowledged.",

year = "2009",

month = jul,

doi = "10.1017/S1431927609098626",

language = "English (US)",

volume = "15",

pages = "600--601",

journal = "Microscopy and Microanalysis",

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publisher = "Cambridge University Press",

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}

TY - JOUR

T1 - Quantification of interfacial roughness of In2O3/ZrO2 superlattice films in 3D

AU - Zhong, X. Y.

AU - Kabius, B.

AU - Schreiber, D. K.

AU - Eastman, J. A.

AU - Fong, D. D.

AU - Petford-Long, A. K.

N1 - Funding Information: References [1] L.J. Gauckler and K. Sasaki, Solid St. Ionics 75 (1995) 203. [2] This research was supported by the US Department of Energy, BES-Materials Sciences under contact number 58931 and 58932. This work was accomplished at the Electron Microscopy Center for Materials Research at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC. The help of Dr. Yuzi Liu and Jon Hiller at Argonne National Laboratory and Dr. Fang Lin at South China Agricultural University are gratefully acknowledged.

PY - 2009/7

Y1 - 2009/7

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U2 - 10.1017/S1431927609098626

DO - 10.1017/S1431927609098626

M3 - Article

AN - SCOPUS:69949161195

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Quantification of interfacial roughness of In2O3/ZrO2 superlattice films in 3D

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