Quantification of nanoscale precipitation in AA7050 using X-ray scattering, electron microscopy and automated particle counting techniques

Alyssa Stubbers, Ning Zhu, Jillian J. Cramer, Timothy J. Eden, Anthony J. Naccarelli, Luke N. Brewer, T. John Balk

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Material strength is dependent on several factors, including precipitation strengthening, which is the main strengthening mechanism in AA7050 aluminum alloys. These alloys contain numerous nanometer-scale precipitates that occur throughout grains and along grain boundaries when subjected to a range of heat treatment conditions. In this study, three different characterization methods were used to characterize these nanoscale precipitates: conventional scanning transmission electron microscopy (STEM); laboratory-based small-angle X-ray scattering (SAXS); and a new software analysis tool developed by Thermo Fisher Scientific: automated particle workflow (APW). Each method was used to determine average precipitate size and volume fraction of precipitation in AA7050-T7451 specimens with variable post-T7 heat treatment procedures. STEM techniques measured the average particle size as ranging from 7.6 to 17.6 nm, compared to 6.3–10.7 nm for SAXS, and 7.4–10.8 nm for APW. Volume fraction determinations varied from 0.23 to 16 %, depending on method, and were the most difficult to quantify. Significant outcomes of the current study are that SAXS and APW are the most accurate methods for determining average particle size and that future work is needed to effectively analyze precipitate volume fraction.

    Original languageEnglish (US)
    Article number114457
    JournalMaterials Characterization
    Volume218
    DOIs
    StatePublished - Dec 2024

    All Science Journal Classification (ASJC) codes

    • General Materials Science
    • Condensed Matter Physics
    • Mechanics of Materials
    • Mechanical Engineering

    Fingerprint

    Dive into the research topics of 'Quantification of nanoscale precipitation in AA7050 using X-ray scattering, electron microscopy and automated particle counting techniques'. Together they form a unique fingerprint.

    Cite this