Abstract
In an attempt to shed some light on apparent inconsistencies as well to circumvent some of the difficulties associated with traditional fracture surface processing, we propose a new, rapid and direct technique for the determination of the fractal dimension of optically clear materials. The advantage of this new technique is that a series of fracture surface processing steps (including vertical sectioning or coating, mounting and polishing) are no longer required. Using conventional fracture surface processing, only one or a few fracture profiles are available for fractal analysis. However, using the new method, numerous fracture profiles are easily obtainable which permits one to probe such question as self-similarity in more detail and provides improved statistical significance. The variability and the suitability of the methodology of the improved FPA and SIA techniques for the fractal analysis of polystyrene specimens are then investigated in detail.
| Original language | English (US) |
|---|---|
| Pages | 2183-2184 |
| Number of pages | 2 |
| State | Published - 1991 |
| Event | 49th Annual Technical Conference -ANTEC '91 - Montreal, Que, Can Duration: May 5 1991 → May 9 1991 |
Other
| Other | 49th Annual Technical Conference -ANTEC '91 |
|---|---|
| City | Montreal, Que, Can |
| Period | 5/5/91 → 5/9/91 |
All Science Journal Classification (ASJC) codes
- General Chemical Engineering
- Polymers and Plastics