Abstract
The combination of x-ray photoelectron spectroscopy with secondary ion mass spectroscopy promises to provide a powerful new approach both to quantitative analysis of surface composition and to the elucidation of surface molecular structure. The ultra high vacuum XPS/SIMS system was tested to characterize the In metal surface during exposure to oxygen. The emission of In** plus has been measured as a function of oxygen exposure concurrently with the O 1s intensity observed by XPS. A report is also given on the examination of clean In surfaces where ions of clusters of In//n** plus where n equals 1-4 is observed. Advantages of these combined techniques are outlined.
| Original language | English (US) |
|---|---|
| Pages | 2217-2220 |
| Number of pages | 4 |
| State | Published - 1977 |
| Event | Proc of the Int Vac Congr, 7th, and the Int Conf on Solid Surf, 3rd, of the Int Union for Vac Sci, Tech and Appl - Vienna, Austria Duration: Sep 12 1977 → Sep 16 1977 |
Other
| Other | Proc of the Int Vac Congr, 7th, and the Int Conf on Solid Surf, 3rd, of the Int Union for Vac Sci, Tech and Appl |
|---|---|
| City | Vienna, Austria |
| Period | 9/12/77 → 9/16/77 |
All Science Journal Classification (ASJC) codes
- General Engineering